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245
11100B–ATARM–31-Jul-12
SAM4S Series [Preliminary]
Figure 12-3. Application Test Environment Example
12.4
Debug and Test Pin Description
Chip 2
Chip n
Chip 1
SAM4
SAM4-based Application Board In Test
JTAG
Connector
Tester
Test Adaptor
JTAG
Probe
Table 12-1.
Debug and Test Signal List
Signal Name
Function
Type
Active Level
Reset/Test
NRST
Microcontroller Reset
Input/Output
Low
TST
Test Select
Input
SWD/JTAG
TCK/SWCLK
Test Clock/Serial Wire Clock
Input
TDI
Test Data In
Input
TDO/TRACESWO
Test Data Out/Trace Asynchronous
Data Out
Output
TMS/SWDIO
Test Mode Select/Serial Wire
Input/Output
Input
JTAGSEL
JTAG Selection
Input
High
Summary of Contents for SAM4S Series
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