Model 4200A-SCS Parameter Analyzer Reference Manual
Section 13: LPT library function reference
4200A-901-01 Rev. C / February 2017
13-169
Defining new test sequences using the
smeas
X
,
sintg
X
, or
savg
X
command adds the command to
the active measure list. The previous measures are still defined and used; however, previous
measures for the second sweep can be eliminated by calling the
clrscn
command. New measures
are defined and used by calling the
smeas
X
,
sintg
X
, or
savg
X
command after a
clrscn
command.
Note that changing the source mode of the SMU can modify the measure range. If the sourcing mode
is changed from voltage to current sourcing (or from current to voltage sourcing), the measure range
may be changed to minimize variations in the SMU output level. See
(on page 13-83) for
recommended command order.
It is recommended that you do not use GPIB instruments when doing sweeps with the
bsweep
X
command. Refer to
(on page 13-24) for additional information.
Example
double bvdss;
.
.
conpin(SMU1, 1, 0);
conpin(GND, 2, 3, 0);
limiti(SMU1, 100e-6); /* Define the I limit for the device. */
rangei(SMU1, 100e-6); /* Select a fixed range */
/* measurement. */
trigil(SMU1, -10e-6); /* Set the trigger point to -10 uA. */
bsweepv(SMU1, 10.0, 50.0, 40, 10.0e-3, &bvdss); /* Sweep */
/* from 10 V to 50 V in 40 */
/* steps with 10 ms settling */
/* time per step. */
This example measures the drain to source breakdown voltage of a field-effect transistor (FET). A linear
voltage sweep is generated from 10.0 V to 50.0 V by SMU1 using the
bsweepv
command. The breakdown
current is set to 10 mA by using the
trigil
command. The voltage at which this current is exceeded is
stored in the variable
bvdss
and is returned to the application processor by the
execut
command.
Also see
(on page 13-9)
(on page 13-67)
(on page 13-16)
(on page 13-36)
(on page 13-36)
(on page 13-44)
(on page 13-45)
(on page 13-88)
(on page 13-47)
(on page 13-47)
