Section 6: Clarius
Model 4200A-SCS Parameter Analyzer Reference Manual
6-342
4200A-901-01 Rev. C / February 2017
Figure 401: Basic schematic of flash testing without a switch matrix
Connections for program and erase testing
For a direct connect configuration, the minimum number of pulse channels is equal to the number of
DUT terminals that need to be simultaneously pulsed, including terminals that must change from
connected to disconnected, or open, states for either the program or erase condition.
The following connection configuration does not require a switch matrix. It provides four channels of
pulse and four SMUs to permit full characterization of single (non-array) nonvolatile memory DUT.
This connection method is used for both the initial program/erase investigation and endurance testing
of a directly-connected DUT.
All interconnects on the instrument chassis are white SMA cables. Cables from the instrument to
device are BNC coaxial. Use triaxial to BNC adapters if necessary to connect to probe manipulators.
