Model 4200A-SCS Parameter Analyzer Reference Manual
Section 4: Multi-frequency capacitance-voltage unit
4200A-901-01 Rev. C / February 2017
4-41
c-ce0 test
This test measures the capacitance as a function of time between the collector and emitter terminals
of a BJT at 0 V. The results (C versus t) are plotted on a graph. This test also calculates the average
capacitance and standard deviation.
Analyze sheet
Test data is displayed in the Analyze sheet:
•
Time: Timestamp for each measurement.
•
Cp_CE: Measured parallel capacitance.
•
Gp_CE: Measured conductance.
•
DCV_CE: Forced DC bias voltage.
•
F_CE: Forced test frequency.
•
CVU1S: Status code for each measurement. Rows highlighted in blue indicate a fault. For details,
see
(on page 6-191).
•
STD_DEV: Calculated value; the standard deviation of the capacitance measurements.
•
AVG_CAP: Calculated value; the average capacitance in farads (F).
c-be0 test
This test measures the capacitance as a function of time between the base and emitter terminals of a
BJT at 0 V. The results (C versus t) are plotted on a graph. This test also calculates the average
capacitance and standard deviation.
Analyze sheet
Test data is displayed in the Analyze sheet:
•
Time: Timestamp for each measurement.
•
Cp_BE: Measured parallel capacitance.
•
Gp_BE: Measured conductance.
•
DCV_BE: Forced DC bias voltage.
•
F_BE: Forced test frequency.
•
CVU1S: Status code for each measurement. Rows highlighted in blue indicate a fault. For details,
see
(on page 6-191).
•
AVG_CAP: Calculated value; the average capacitance in farads (F).
•
STD_DEV: Calculated value; the standard deviation of the capacitance measurements.
