Model 4200A-SCS Parameter Analyzer Reference Manual
Section 6: Clarius
4200A-901-01 Rev. C / February 2017
6-171
Segment Arb stressing
The stress phase example figure below shows an example of how a DUT can be stressed using
Segment Arb waveforms. During a stress phase, the matrix connects the channels of the Keithley
Instruments pulse card to the drain and gate of the DUT. The pulse generator stresses the drain and
gate by outputting Segment Arb waveforms.
Two 4200-SMUs (SMU1 and SMU2) are connected to the substrate and source terminals of the DUT.
They are set to 0 V to effectively ground the terminals.
Figure 331: Segment stressing: Stress phase example
Set up segment stress/measure counts
In this mode, Clarius runs stress/measure cycles for segments. You can set up the timing for:
•
Linear: After the first stress cycle, all stress times are identical.
•
Log: After the first stress cycle, all stress times increase logarithmically.
•
List: You set the stress cycle times.
To set up the timing:
1. Select
Segment Stress/Measure Mode
.
2. Select the stress time:
Linear
,
Log
, or
List
.
3. If you selected:
Linear: Go to
Set up Linear Segment Stress/Measure counts
(on page 6-172).
Log: Go to
Set up Log Segment Stress/Measure counts
(on page 6-173).
List: Go to
Set up List Segment Stress/Measure counts
(on page 6-174).
