Model 4200A-SCS Parameter Analyzer Reference Manual
Section 3: Source-measure hardware
4200A-901-01 Rev. C / February 2017
3-37
The timing elements act as follows:
•
Hold Time (HT): The sweep graph shows two sweeps that correspond to the two steps shown
directly above in the step graph. Note that at the start of each sweep there is a hold time. The
hold time is a global setting. Therefore, it is the same for all SMUs in the test system.
•
Delay (D): The delay time allows the source to settle and is measurement-range dependent. All
SMUs in the test system are synchronized. Therefore, the delay time applied by the most-delayed
SMU is the delay time applied by all SMUs.
•
Sweep Delay (SD): The sweep delay provides additional settling time for each step in the sweep.
It is a global setting. and therefore is applied identically to all SMUs in the test system.
•
Measure Time (MT): The measure time is determined by the Filter Factor and the A/D Aperture
Time. All SMUs in the test system are synchronized. Therefore, the Measure Time (MT) for the
SMU requiring the longest measure time is the same for all SMUs in the test system.
Sampling Mode timing diagram
The following figure shows a timing diagram for the Sampling Mode.
Figure 74: Sampling Mode timing diagram
A range-dependent delay (D) is automatically applied by a SMU before each measurement to allow
for source settling. All SMUs in the test system are synchronized. Therefore, the delay time applied
by the most-delayed SMU is the delay time applied by all SMUs.
In sampling mode, all device terminals are set to a static operation mode: Open, Common, Voltage
Bias, or Current Bias. Therefore, in sampling mode, the range-dependent delay may not be needed,
because source settling time is not needed after the initial application of current or voltage. You can
set the delay to 0 s by setting the Delay Factor to 0.
The Measure Time (MT) is determined by the Filter Factor and the A/D Aperture Time. All SMUs in
the test system are synchronized. Therefore, the Measure Time (MT) for the SMU requiring the
longest measure time is the same for all SMUs in the test system.
