Model 4200A-SCS Parameter Analyzer Reference Manual
Section 13: LPT library function reference
4200A-901-01 Rev. C / February 2017
13-45
This example collects information on the low-level gate leakage current of a metal-oxide field-effect
transistor (MOSFET). Sixteen integrated measurements are made as the voltage is increased from 0 V to
25 V.
Also see
(on page 13-9)
(on page 13-13)
(on page 13-16)
(on page 13-88)
smeasX
This command allows a number of measurements to be made by a specified instrument during a
sweep
X
command. The
results of the measurements are stored in the defined array.
Usage
int smeasi(int
instr_id
, double *
result
);
int smeast(int
instr_id
, double *
result
);
int smeasv(int
instr_id
, double *
result
);
instr_id
The instrument identification code of the measuring instrument
result
The floating point array that stores the results
Details
This command is used to create an entry in the measurement scan table. During any of the sweep
commands, a measurement scan is done for every force point in the sweep. During each scan, a
measurement is made for every entry in the scan table. The measurements are made in the same
order in which the entries were made in the scan table.
The
smeas
X
command sets up the new scan table entry to make an ordinary measurement. The
measurement results are stored in the array specified by the
result
parameter. Each time a
measurement scan is made, a new measurement result is stored at the next location in the
result
array. If the scan table is not cleared, doing multiple sweeps continues adding new measurement
results to the end of the array. Care must be taken that the results array is large enough to hold all
measurements that are made before the scan table is cleared. The scan table is cleared by an explicit
call to the
clrscn
command or implicitly when the
devint
or
execut
command is called.
