Intel
®
81341 and 81342 I/O Processors
December 2007
Developer’s Manual
Order Number: 315037-002US
705
SRAM Memory Controller—Intel
®
81341 and 81342
8.6.7
SRAM ECC Test Register — SECTST
This register allows testing between the SRAM ECC logic and the memory subsystem
(
Section 8.3.3.6, “ECC Testing” on page 691
). To test error handling software, the
programmer writes this register with a non-zero masking function. Any subsequent
writes to memory stores a masked version of the computed ECC. Therefore, any
subsequent reads to these locations result in an ECC error.
Table 426. SRAM ECC Test Register — SECTST
Bit
Default
Description
31:07
00 0000H
Reserved
06:00
00H
ECC Mask: 7-bit ECC mask. Each bit of the generated ECC is XORed with the appropriate bit in this
mask field before the ECC is stored into memory. See
Section 8.3.3.6, “ECC Testing” on page 691
.
PCI
IOP
Attributes
Attributes
28
24
20
16
12
8
4
0
31
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rv
na
rw
na
rw
na
rw
na
rw
na
rw
na
rw
na
rw
na
Attribute Legend:
RV = Reserved
PR = Preserved
RS = Read/Set
RW = Read/Write
RC = Read Clear
RO = Read Only
NA = Not Accessible
Intel XScale
®
processor Local Bus Address Offset
+1518H