User Manual
969
Rev. 1.1
2019-03-18
TLE984xQX
Microcontroller with LIN and Power Switches for Automotive Applications
Application Information
Table 517 ESD “Gun Test”
Performed Test
Result
Unit
Remarks
ESD at pin LIN, versus GND
≥
6
kV
1)
positive pulse
1) ESD susceptibility “ESD GUN”, tested by external test house (IBEE Zwickau, EMC Test report Nr. 11-01-16), according
to "LIN Conformance Test Specification Package for LIN 2.1, October 10th, 2008" and "Hardware Requirements for
LIN, CAN and FlexRay Interfaces in Automotive Application – AUDI, BMW, Daimler, Porsche, Volkswagen – Revision 1.3
/ 2012"
ESD at pin LIN, versus GND
≤
-6
kV
negative pulse
ESD at pin VS, VBAT_SENSE, MONx,
HS, versus GND
≥
6
kV
positive pulse
ESD at pin VS, VBAT_SENSE, MONx,
HS, versus GND
≤
-6
kV
negative pulse