1. Overview
Rev.3.00 Jul. 19, 2007 page 21 of 532
REJ09B0397-0300
H8/3857 Group
H8/3854 Group
Pin No.
Pin No.
Type
Symbol
FP-144H
TFP-144
Pad No.
FP-100B
TFP-100G
Pad No.
I/O
Name and Functions
System
control
RES
35 35 24 24 Input
Reset:
When this pin is
driven low, the chip is reset
FWE
36 36 25 25 Input
Flash write enable:
This
pin enables or disables flash
memory programming. In
the mask ROM version,
ground this pin to the V
SS
potential.
TEST
32 32 22 22 Input
Test:
This is a test pin, not
for use in application
systems. It should be
connected to V
SS
.
TEST2
33 33 16 16 Input
Test pin:
This pin sets the
flash memory operating
mode. In the mask ROM
version, ground this pin to
the V
SS
potential.
Interrupt
pins
IRQ
0
IRQ
1
IRQ
2
IRQ
3
IRQ
4
141
135
134
133
16
141
135
134
133
16
96
92
⎯
91
15
96
92
⎯
91
15
Input
External interrupt request
4 to 0 (H8/3857 Group)
External interrupt request
4, 3, 1, 0 (H8/3854 Group)
These are input pins for
external interrupts for which
there is a choice between
rising and falling edge
sensing.
WKP
7
to
WKP
0
1 to 8
1 to 8
100,
1 to 7
100,
1 to 7
Input
Wakeup interrupt request
0 to 7:
These are input pins
for external interrupts that
are detected at the falling
edge
Timer
pins
TMOW 140
140
95
95
Output
Clock output:
This is an
output pin for waveforms
generated by the timer A
output circuit
TMIB
135
135 92 92
Input
Timer B event counter
input:
This is
an event input pin for input
to the timer B counter
TMIC
134
134
⎯
⎯
Input
Timer C event counter
input (H8/3857 Group
only):
This is an event input
pin for input to the timer C
counter
Summary of Contents for F-ZTAT H8 Series
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Page 194: ...7 RAM Rev 3 00 Jul 19 2007 page 168 of 532 REJ09B0397 0300...
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Page 274: ...9 Timers Rev 3 00 Jul 19 2007 page 248 of 532 REJ09B0397 0300...
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