LTE Multi Evaluation Measurement
R&S
®
CMW-KM5xx/-KS5xx
680
User Manual 1173.9628.02 ─ 16
FETCh:LTE:MEAS<i>:MEValuation:SEMask:EXTReme?
READ:LTE:MEAS<i>:MEValuation:SEMask:EXTReme?
CALCulate:LTE:MEAS<i>:MEValuation:SEMask:EXTReme?
Return the extreme single value results of the spectrum emission measurement.
The values described below are returned by
FETCh
and
READ
commands.
CALCulate
commands return limit check results instead, one value for each result listed below.
Return values:
<Reliability>
<OutOfTolerance>
Out of tolerance result, i.e. percentage of measurement inter-
vals of the statistic count for spectrum emission measurements
exceeding the specified spectrum emission mask limits.
Range:
0 % to 100 %
Default unit: %
<OBW>
Occupied bandwidth
Range:
0 MHz to 40 MHz
Default unit: Hz
<TXpowerMin>
Minimum total TX power in the slot
Range:
-100 dBm to 55 dBm
Default unit: dBm
<TXpowerMax>
Maximum total TX power in the slot
Range:
-100 dBm to 55 dBm
Default unit: dBm
Example:
See
Performing Single-Shot Measurements
Usage:
Query only
Firmware/Software:
V2.0.10
FETCh:LTE:MEAS<i>:MEValuation:SEMask:MARGin:ALL?
Returns spectrum emission mask margin results. A negative margin indicates that the
trace is located above the limit line, i.e. the limit is exceeded.
Results are provided for the current, average and maximum traces. For each trace, 24
values related to the negative (Neg) and positive (Pos) offset frequencies of emission
mask areas 1 to 12 are provided. For inactive areas, NCAP is returned.
The number to the left of each result parameter is provided for easy identification of the
parameter position within the result array.
Return values:
<1_Reliability>
Command Reference
135-1095-0799