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LTE Multi Evaluation Measurement
R&S
®
CMW-KM5xx/-KS5xx
655
User Manual 1173.9628.02 ─ 16
<ChannelType>
PUSCh | PUCCh
PUSCh
: slot contains only PUSCH
PUCCH
: slot contains only PUCCH
Example:
See
Performing Single-Shot Measurements
Usage:
Query only
Firmware/Software:
V2.0.10: MODulation command
V2.0.20: ACLR and SEMask commands added
FETCh:LTE:MEAS<i>:MEValuation:MODulation:DALLocation?
FETCh:LTE:MEAS<i>:MEValuation:ACLR:DALLocation?
FETCh:LTE:MEAS<i>:MEValuation:SEMask:DALLocation?
Returns the detected allocation for the measured slot.
If the same slot is measured by the individual measurements, all commands yield the
same result. If different statistic counts are defined for the modulation, ACLR and spec-
trum emission mask measurements, different slots may be measured and different
results may be returned by the individual commands.
Return values:
<Reliability>
<NrResBlocks>
Number of allocated resource blocks
Range:
1 to 100
<OffsetResBlocks>
Offset of the first allocated resource block from the edge of the
allocated UL transmission bandwidth
Range:
0 to 99
Example:
See
Performing Single-Shot Measurements
Usage:
Query only
Firmware/Software:
V2.0.10: MODulation command
V2.0.20: ACLR and SEMask command
FETCh:LTE:MEAS<i>:MEValuation:VFTHroughput?
Queries the "View Filter Throughput", see
Return values:
<Reliability>
<VFThroughput>
Range:
0 % to 100 %
Default unit: %
Example:
See
Performing Single-Shot Measurements
Usage:
Query only
Firmware/Software:
V3.0.20
Command Reference
深圳德标仪器
135-1095-0799