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Chapter 35 IEEE 1149.1 Test Access Port Controller (JTAGC)
MPC5606BK Microcontroller Reference Manual, Rev. 2
948
Freescale Semiconductor
accessed or both. Instructions are shifted in through TDI while the TAP controller is in the Shift-IR state,
and latched on the falling edge of TCK in the Update-IR state. The latched instruction value can only be
changed in the update-IR and test-logic-reset TAP controller states. Synchronous entry into the
test-logic-reset state results in the IDCODE instruction being loaded on the falling edge of TCK.
Asynchronous entry into the test-logic-reset state results in asynchronous loading of the IDCODE
instruction. During the capture-IR TAP controller state, the instruction shift register is loaded with the
value 0b10101, making this value the register’s read value when the TAP controller is sequenced into the
Shift-IR state.
35.7.2
Bypass register
The bypass register is a single-bit shift register path selected for serial data transfer between TDI and TDO
when the BYPASS, or reserve instructions are active. After entry into the capture-DR state, the single-bit
shift register is set to a logic 0. Therefore, the first bit shifted out after selecting the bypass register is
always a logic 0.
35.7.3
Device identification register
The device identification register, shown in
, allows the part revision number, design center, part
identification number, and manufacturer identity code to be determined through the TAP. The device
identification register is selected for serial data transfer between TDI and TDO when the IDCODE
instruction is active. Entry into the capture-DR state while the device identification register is selected
loads the IDCODE into the shift register to be shifted out on TDO in the Shift-DR state. No action occurs
in the update-DR state.
4
3
2
1
0
R
1
0
1
0
1
W
Instruction Code
Reset
0
0
0
0
1
Figure 35-2. 5-bit instruction register
IR[4:0]: 0_0001 (IDCODE)
Access: R/O
0
1
2
3
4
5
6
7
8
9
10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31
R
PRN
DC
PIN
MIC
ID
W
Reset
0
0
0
0
0
1
1
0
1
0
1
0
0
1
0
0
0
0
1
0
0
0
0
0
0
0
0
1
1
1
0
1
Figure 35-3. Device identification register
Table 35-2. Device identification register field descriptions
Field
Description
0–3
PRN
Part revision number. Contains the revision number of the device. This field changes with each revision
of the device or module.
4–9
DC
Design center. For the MPC5606BK this value is 0x1A.
Summary of Contents for MPC5605BK
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Page 20: ...MPC5606BK Microcontroller Reference Manual Rev 2 20 Freescale Semiconductor...
Page 103: ...MPC5606BK Microcontroller Reference Manual Rev 2 Freescale Semiconductor 103 Clocks and power...
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