Keysight Technologies D9020DDRC, Manual

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18 Custom Mode Read-Write Eye-Diagram Tests
328 DDR2(+LP) Compliance Testing Methods of Implementation
Probing for Custom Mode Read-Write Eye Diagram Tests
When performing the Custom Mode Read-Write Eye Diagram tests, the DDR2(+LP) Compliance
Test Application will prompt you to make the proper connections as shown in
Figure 36 .
You can use any of the oscilloscope channels as the Pin Under Test (PUT) source channel. You can
identify the channels used for each signal in the Configuration tab of the DDR2(+LP) Compliance
Test Application. (The channels shown in
Figure 36
are just examples).
For more information on the probe amplifiers and differential probe heads, see Chapter 20 , “InfiniiMax
Probing,” starting on page 351.
Test Procedure
1 Start the automated test application as described in “Starting the DDR2(+LP) Compliance
Test Application"
on page 27.
2 Ensure that the RAM reliability test software is running on the computer systems where the DDR2
Device Under Test (DUT) is attached. This software will perform a test on all the unused RAM on
the system by producing repetitive bursts of read-write data signals to the DDR2 memory.
3 Connect the differential solder-in probe head to the PUTs on the DDR2 devices.
4 Connect the oscilloscope probes to any of the oscilloscope channels.
5 In the DDR2 Test application, click the Set Up tab.
6 Select Custom as the Test Mode option. This selection shows an additional command button -
Set Mask File.
Figure 36 Probing for Custom Mode Read-Write Eye Diagram Tests
Infiniium Oscilloscope
DDR2 DIMM
InfiniiMax solder-in probes