Keysight Technologies D9020DDRC, Manual

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9 Single-Ended Signals Overshoot/Undershoot Tests
136 DDR2(+LP) Compliance Testing Methods of Implementation
AC Overshoot Test Method of Implementation
The Overshoot test can be divided into two sub-tests: Overshoot amplitude and overshoot area.
The purpose of this test is to verify that the overshoot value of the test signal within a user-specific
region is lower than or equal to the conformance limit of the maximum peak amplitude allowed for
overshoot test as specified in the JEDEC specification.
When there is an overshoot, the overshoot area is calculated based on the overshoot width. The
overshoot area should be lower than or equal to the conformance limit of the maximum overshoot
area allowed as specified in the JEDEC specification.
Signals of Interest
Mode Supported: DDR2, LPDDR2
Signal cycle of interest: READ or WRITE
Signal(s) of Interest:
• Data Signal OR
• Data Strobe Signal OR
• Address Signal OR
• Control Signal OR
• Data Mask Control Signal OR
• Clock Signal
Signals required to perform the test on the oscilloscope:
• Pin Under Test, PUT - any signal of interest, as defined above
Test Definition Notes from the Specification
Table 81 AC Overshoot Specification for Address and Control Pin
A0-A15, BA0-BA2, CS, RAS, CAS, WE, CKE, ODT
Parameter Specification
DDR2-400 DDR2-533 DDR2-667 DDR2-800
Maximum peak amplitude allowed for overshoot area 0.5(0.9)
1
V 0.5(0.9)
1
V 0.5(0.9)
1
V 0.5(0.9)
1
V
Maximum overshoot area above V
DD
1.33 V-ns 1.0 V-ns 0.8 V-ns 0.66 V-ns
Table 82 AC Overshoot Specification for Clock, Data, Strobe and Mask Pins
DQ, (U/L/R)DQS, (U/L/R)DQS, DM, CK, CK
Parameter Specification
DDR2-400 DDR2-533 DDR2-667 DDR2-800
Maximum peak amplitude allowed for overshoot area 0.5 V 0.5 V 0.5 V 0.5 V
Maximum overshoot area above V
DDQ
0.38 V-ns 0.28 V-ns 0.23 V-ns 0.23 V-ns