OPERATION IN EXPERT MODE
LSM 510
DuoScan
Carl Zeiss
Macro Menu
LSM 510 META
DuoScan
4-198
B 45-0021 e
03/06
Multiple Profile panel
In the Multiple Profile panel the parameters necessary for the
Multiple Profile
procedure can be defined.
Objective
An objective has to be chosen from the currently used objectives of the stand.
Gain
The detector gain can be modified. If the
Find Gain
procedure has been
applied the optimized gain value is displayed. This value can be changed by use
of the slider or by clicking on the FORWARD / BACKWARD buttons.
Overlap [%]
The relative overlap between single profiles can be adjusted between 10 % and
50 % of a single profile length. For more pronounced surface features a smaller
overlap is sufficient, for rather smooth surfaces larger overlap values are
recommended.
Z step [
μ
m]
The single Z step in the
Multiple Profile
Mode can be varied between 0.1
μ
m
and 0.6
μ
m in 0.1
μ
m steps.
Profile data:
Maximum format:
16384 pixels x 2048 slices
Variable overlap:
10 ... 50 % of single profile length
Scan Speed:
8 (fixed)
Scan time:
20 ... 210 seconds (depending on Z)
Height difference DZ:
0.1 ... 0.6 µm [in steps of 0.1]
Total height Z:
50 µm ... 1 mm
Auto alignment:
Cross-correlation in X, Y & Z
Multiple Stack panel
In the
Multiple Stack
panel the parameters necessary for the
Multiple Stack
procedure can be defined.
Objective
An objective has to be chosen from the currently used objectives on the stand.
Gain
The detector gain can be modified. If the
Find Gain
procedure has been
applied the optimized gain value is displayed. This value can be changed by
use of the slider or by clicking on the FORWARD / BACKWARD buttons.
Overlap [%]
The relative overlap between single stacks can be adjusted between 10 % and
50 % of the single image length. For more pronounced surface features a
smaller overlap is sufficient, for rather smooth surfaces larger overlap values
are recommended.
Z Step [
μ
m]
The Z step between the single slices of a stack can be defined between 0.1
and 100 microns.
