Intel 8XC196NT, User Manual

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Glossary-9
GLOSSARY
repeatability error The difference between corresponding code
transitions from different actual characteristics taken
from the same converter on the same channel with the
same temperature, voltage, and frequency conditions.
The amount of repeatability error depends on the
comparator’s ability to resolve very similar voltages
and the extent to which random noise contributes to
the error.
reserved memory A memory location that is reserved for factory use or
for future expansion. Do not use a reserved memory
location except to initialize it with FFH.
resolution The number of input voltage levels that an A/D
converter can unambiguously distinguish between.
The number of useful bits of information that the
converter can return.
sample capacitor A small (2–3 pF) capacitor used in the A/D converter
circuitry to store the input voltage on the selected
input channel.
sample delay The time period between the time that A/D converter
receives the “start conversion” signal and the time
that the sample capacitor is connected to the selected
channel.
sample delay uncertainty The variation in the sample delay.
sample time The period of time that the sample window is open.
(That is, the length of time that the input channel is
actually connected to the sample capacitor.)
sample time uncertainty The variation in the sample time.
sample window The period of time that begins when the sample
capacitor is attached to a selected channel of an A/D
converter and ends when the sample capacitor is
disconnected from the selected channel.
sampled inputs All input pins, with the exception of RESET#, are
sampled inputs. The input pin is sampled one state
time before the read buffer is enabled. Sampling
occurs during PH1 (while CLKOUT is low) and
resolves the value (high or low) of the pin before it is
presented to the internal bus. If the pin value changes
during the sample time, the new value may or may not
be recorded during the read.