Table 3-45. Trip-Zone Control Register (TZCTL) Field Descriptions (continued)
Bit
Field
Value
Description
1-0
TZA
When a trip event occurs the following action is taken on output EPWMxA. Which trip-zone pins
can cause an event is defined in the TZSEL register.
00
High-impedance (EPWMxA = High-impedance state)
01
Force EPWMxA to a high state
10
Force EPWMxA to a low state
11
Do nothing, no action is taken on EPWMxA.
3.4.5.4 Trip-Zone Enable Interrupt Register (TZEINT)
Figure 3-97. Trip-Zone Enable Interrupt Register (TZEINT)
15
8
Reserved
R -0
7
6
5
4
3
2
1
0
Reserved
DCBEVT2
DCBEVT1
DCAEVT2
DCAEVT1
OST
CBC
Reserved
R-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 3-46. Trip-Zone Enable Interrupt Register (TZEINT) Field Descriptions
Bits
Name
Value
Description
15-3
Reserved
Reserved
6
DCBEVT2
Digital Comparator Output B Event 2 Interrupt Enable
0
Disabled
1
Enabled
5
DCBEVT1
Digital Comparator Output B Event 1 Interrupt Enable
0
Disabled
1
Enabled
4
DCAEVT2
Digital Comparator Output A Event 2 Interrupt Enable
0
Disabled
1
Enabled
3
DCAEVT1
Digital Comparator Output A Event 1 Interrupt Enable
0
Disabled
1
Enabled
2
OST
Trip-zone One-Shot Interrupt Enable
0
Disable one-shot interrupt generation
1
Enable Interrupt generation; a one-shot trip event will cause a EPWMx_TZINT PIE interrupt.
1
CBC
Trip-zone Cycle-by-Cycle Interrupt Enable
0
Disable cycle-by-cycle interrupt generation.
1
Enable interrupt generation; a cycle-by-cycle trip event will cause an EPWMx_TZINT PIE interrupt.
0
Reserved
Reserved
Enhanced Pulse Width Modulator (ePWM) Module
354
TMS320x2806x Microcontrollers
SPRUH18I – JANUARY 2011 – REVISED JUNE 2022
Copyright © 2022 Texas Instruments Incorporated
Содержание TMS320 2806 Series
Страница 2: ......