3.2.9 Digital Compare (DC) Submodule
illustrates where the digital compare (DC) submodule signals interface to other submodules in the
ePWM system.
The digital compare (DC) submodule compares signals external to the ePWM module (for instance, COMPxOUT
signals from the analog comparators) to directly generate PWM events/actions which then feed to the event-
trigger, trip-zone, and time-base submodules. Additionally, blanking window functionality is supported to filter
noise or unwanted pulses from the DC event signals.
Event A
Qual
DCAL
DCAEVT1
DCAEVT2
Event
Triggering
DCAEVT1.inter
DCAEVT2.inter
DCBEVT1.soc
DCBEVT1.inter
DCBEVT2.inter
DCAEVT1.sync
DCAEVT1.soc
DCBEVT1.sync
DCBH
Event B
Qual
DCBL
DCBEVT1
DCBEVT2
Event
Filtering
Blanking
Window
Counter
Capture
DCEVTFILT
D
C
T
R
I
P
S
E
L
TZ1
TZ2
TZ3
COMPxOUT
COMP
DCAH
Digital Compare Submodule
Time-Base
submodule
Trip-Zone
submodule
Event-Trigger
submodule
DCAEVT1.force
DCAEVT2.force
DCBEVT1.force
DCBEVT2.force
COMP
COMP
GPIO
MUX
Figure 3-45. Digital-Compare Submodule High-Level Block Diagram
3.2.9.1 Purpose of the Digital Compare Submodule
The key functions of the digital compare submodule are:
• Analog Comparator (COMP) module outputs and TZ1, TZ2, and TZ3 inputs generate Digital Compare A
High/Low (DCAH, DCAL) and Digital Compare B High/Low (DCBH, DCBL) signals.
• DCAH/L and DCBH/L signals trigger events which can then either be filtered or fed directly to the trip-zone,
event-trigger, and time-base submodules to:
– generate a trip zone interrupt
– generate an ADC start of conversion
– force an event
– generate a synchronization event for synchronizing the ePWM module TBCTR.
• Event filtering (blanking window logic) can optionally blank the input signal to remove noise.
Enhanced Pulse Width Modulator (ePWM) Module
SPRUH18I – JANUARY 2011 – REVISED JUNE 2022
TMS320x2806x Microcontrollers
297
Copyright © 2022 Texas Instruments Incorporated
Содержание TMS320 2806 Series
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