Signal Descriptions
5-129
18524C/0—Nov1996
AMD-K5 Processor Technical Reference Manual
5.2.52
TDO (Test Data Output)
Output
Summary
TDO carries output data for testing on the Test Access Port
(TAP).
Driven and Floated
The processor drives TDO every falling TCK edge, but only
during the shift_IR and shift_DR states. It is floated at all other
times.
TDO is always driven, except when floated and while RESET
or INIT is asserted.
Details
Instructions are shifted out of the processor on TDO during the
shift_IR TAP state. Data are shifted out of the processor on
TDO during the shift_DR TAP state.
See the IEEE Standard Test Access Port and Boundary-Scan
Architecture (IEEE 1149.1) specification for a description of
how the TAP signals and instructions are used for testing.
Summary of Contents for AMD-K5
Page 1: ...AMD K5 Processor Technical Reference Manual TM...
Page 10: ...x AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 24: ...1 4 Overview AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 54: ...2 30 Internal Architecture AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 116: ...4 26 Performance AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 356: ...6 44 System Design AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 380: ...7 24 Test and Debug AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 396: ...A 16 AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 406: ...I 10 Index AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...