5-128
Bus Interface
AMD-K5 Processor Technical Reference Manual
18524C/0—Nov1996
5.2.51
TDI (Test Data Input)
Input
Summary
TDI carries input test data and instructions for testing on the
Test Access Port (TAP).
Sampled
The processor samples TDI every rising TCK edge, but only
during the shift_IR and shift_DR states. TDI has an internal
pullup resistor.
TDI is always sampled, except while RESET or INIT is
asserted.
Details
Instructions are shifted into the processor on TDI during the
shift_IR TAP state. Data are shifted into the processor on TDI
during the shift_DR TAP state.
See the IEEE Standard Test Access Port and Boundary-Scan
Architecture (IEEE 1149.1) specification for a description of
how the TAP signals and instructions are used for testing.
Summary of Contents for AMD-K5
Page 1: ...AMD K5 Processor Technical Reference Manual TM...
Page 10: ...x AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 24: ...1 4 Overview AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 54: ...2 30 Internal Architecture AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 116: ...4 26 Performance AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 356: ...6 44 System Design AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 380: ...7 24 Test and Debug AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 396: ...A 16 AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...
Page 406: ...I 10 Index AMD K5 Processor Technical Reference Manual 18524C 0 Nov1996...