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14 Waveform Evaluation Function
14
Waveform Evaluation Function
14.1 Waveform GO/NG Evaluation (MEM, FFT
Function)
The waveform evaluation function can be used from the Memory function (single screen, X-Y single
screen), FFT function (1 screen standard, 1 screen Nyquist).
GO (pass) or NG (fail) evaluation of the input signal waveform can be performed using an evaluation area
specified by the user. This can detect irregular waveforms. Depending on evaluation results, signals will
be output on the external control terminals.
All channels being displayed can be used for GO/NG evaluation.
Setting Workflow (After the Input and Other Settings Have Been Finished)
Set the evaluation area
Load
Load a previously created evaluation area and
settings from the File screen.
Create a new area
Create an evaluation area using the eight edit
commands.
Store the evaluation area in memory, then store
the data on storage media on the File screen.
Set waveform evaluation
OFF
Disable waveform evaluation.
OUT
Return NG if any part of the waveform leaves the
evaluation area.
ALL OUT
Return NG if the entire waveform leaves the
evaluation area.
Set GO/NG stop mode
GO
Stop recording on GO result.
NG
Stop recording on NG result.
GO & NG
Stop recording on GO or NG result.
Measurement starts
Press the
START
key to start measurement.
Data acquisition will start when the trigger conditions are met.
Execute waveform
GO/NG evaluation
Once the evaluation process is complete, the result will be output as the
signals from the external control terminals.
If the evaluation result satisfies the stop conditions, automatic saving and
automatic printing will be performed, if enabled.
When using memory segmentation, the same block is repeatedly measured
as long as the stop conditions are not satisfied. Once the stop conditions are
satisfied, measurement moves to the next block.
W
aveform Evaluation Function
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Summary of Contents for MR8827
Page 19: ...14 Operation Precautions ...
Page 81: ...76 Start and Stop Measurement ...
Page 111: ...106 Manage Files ...
Page 125: ...120 Miscellaneous Printing Functions ...
Page 143: ...138 View Block Waveforms ...
Page 191: ...186 Setting Output Waveform Parameters ...
Page 291: ...286 FFT Analysis Modes Measurable Ranges With Octave Analysis 1 1 OCT 1 3 OCT ...
Page 292: ...287 FFT Analysis Modes 1 1 OCT 1 3 OCT 13 FFT Function ...
Page 293: ...288 FFT Analysis Modes 1 1 OCT 1 3 OCT ...
Page 295: ...290 FFT Analysis Modes ...
Page 309: ...304 Editor Command Details ...
Page 387: ...382 Module Specifications ...
Page 405: ...400 Dispose of the Instrument Lithium Battery Removal ...
Page 431: ...A26 FFT Definitions ...
Page 436: ......