249
FFT Analysis Condition Settings
13.3.4
Thin Out and Calculating Data
When performing FFT analysis of data measured using the memory function, the measurement data can
be thinned before calculation.
If the sampling frequency is too high and you get unexpected results, thin the data before calculation to
increase the frequency resolution.
Original waveform
Thinned waveform
Procedure
Press the
STATUS
key to open the Status screen, and then select the
[Status]
sheet.
1
Select the reference data.
Move the cursor to
[Reference]
, and select
[From
Memory]
.
1
2
2
Select the thinning amount.
Move the cursor to
[Save Thin]
.
Off
Do not thin data.
(Default setting)
1/10
Skip every 10 data points.
1/100
Skip every 100 data points.
1/1000
Skip every 1000 data points.
• The
[Save Thin]
setting can only be set when
[Reference]
is set to
[From Memory]
.
• The range that can be set for thinning changes depending on the timebase measured by the memory
function.
• The frequency is selected automatically. The setting cannot be changed.
•
When thinning, aliasing occurs and waveforms that did not originally exist may be observed.
Make settings after sufficient consideration of the frequencies included in waveforms.
13
FFT
Function
Summary of Contents for MR8827
Page 19: ...14 Operation Precautions ...
Page 81: ...76 Start and Stop Measurement ...
Page 111: ...106 Manage Files ...
Page 125: ...120 Miscellaneous Printing Functions ...
Page 143: ...138 View Block Waveforms ...
Page 191: ...186 Setting Output Waveform Parameters ...
Page 291: ...286 FFT Analysis Modes Measurable Ranges With Octave Analysis 1 1 OCT 1 3 OCT ...
Page 292: ...287 FFT Analysis Modes 1 1 OCT 1 3 OCT 13 FFT Function ...
Page 293: ...288 FFT Analysis Modes 1 1 OCT 1 3 OCT ...
Page 295: ...290 FFT Analysis Modes ...
Page 309: ...304 Editor Command Details ...
Page 387: ...382 Module Specifications ...
Page 405: ...400 Dispose of the Instrument Lithium Battery Removal ...
Page 431: ...A26 FFT Definitions ...
Page 436: ......