Omron FQ2-S/CH Series, User Manual, Page: 249 / 590

Inspecting with the Shape Search II Inspection Item FQ2-S/CH User’s Manual
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4
Setting Up Inspect
ions
4-10 Inspecting with the Shape Search II Inspection Item
FQ2-S1 FQ2-S2 FQ2-S3 FQ2-S4
Shape Search II Inspection Item
This inspection item is used to search for the portion of the input image that most closely resembles an image
pattern that is called a model. The model is registered in advance based on a characteristic feature of the
measurement object.
You can output the correlation, which tells how closely the portion of the image matches the model. You can
also output the position of the measurement object and the angle of the measurement object. For the normal
Search inspection item, a model that concentrates on the color and brightness of the image pattern is used, but
in the Shape Search II, a model that concentrates on the outline information is used.
This inspection item enables robust, high-speed, high-precision detection of models even when lighting is
reflected from the workpieces, when the shapes of the workpieces are inconsistent, when the orientation of the
workpieces change, when noise is superimposed, when part of the image is blocked, or when there are other
fluctuations in the environment.
OK NG
Search region (region to
search for the model)
Search for sections that are similar to the model.
Model
(desired image pattern)
Sample Settings Sample Measurement
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