TMPM5200-2
5-99
e Tab
ifier (Model 5110 is not
available). When the lock-in amplifier is connected to the SPM controller, you have to
set the instrument using the software to display the tab window for electrostatic force
measurement.
ere, we discuss how to observe capacitance measurement SCFM.
■
Affixin
ce measurement SCFM)
correctly, it is essential th
d
p
5.5.4 Electrostatic Forc
You can perform electrostatic force measurement (capacitance measurement SCFM) by
additionally installing the optional Model 7265 Lock-in Ampl
H
g a specimen
In order to observe an electrostatic force image (capacitan
at conductivity between the specimen and the specimen stub is
efinitely secured. Affix the specimen firmly to the specimen stub using conductive
te instead of using double-faced tape.
as
Specimen
Conductive paste
Specimen stub
■
Selecting
frequency of the cantilever. It is necessary to select 80 kHz or less as the primary
reson
The
frequ
■
Checking
hing
Befo
then
AFM
■
Observation of a topography image
Observe a topography image of the specimen surface, and confirm that you can obtain an
a cantilever
In capacitance measurement you detect a component in 3F of the contact resonance
ance frequency so that the resonance frequency does not exceed 250 kHz at 3F.
recommended cantilever is the Nanosensor made CONT PtIr 5 (oscillation
ency 13 kHz, spring constant 0.2 N/m).
before approac
re performing approaching, affix specimen, adjust the laser and photodiode, and
perform coarse approaching in the way you do when performing usual Contact
measurement.
optimum image. Then retract the tip.