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MEASUREMENT OPERATION
TMPM5200-2
5-137
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I-V measurement
The following is the procedure for measuring the I-V characteristic of the specimen
surface.
1.
Observe a current image and grab it.
2.
Select the I-V Curve radio button at the left bottom of the STM tab window.
3.
Click on the I-V button.
The I-V Parameters window opens.
4.
Click on the Retract On button in the STM tab window.
Before setting the position for I-V measurement, retract the tip. This is for
preventing the tip from contacting the specimen surface and deforming, when
you move the tip to the position to measure.
5.
Click on the Position button on the I-V Parameters window.
The I-V Parameters window will close and the Tip position window will open.
Move the mouse cursor to the current image in the Display Window; then the cursor
will change to a hand mark. The present position of the cantilever is displayed with
a “+” mark. Usually, the initial position of the cantilever is the top left corner as
shown below.
Mouse cursor
Tip position
