TMPM5200-2
5-69
will observe a viscoelasticity image using the Contact mode. Depending on
may not be able to obtain any good image. At times you obtain
es due to the adhesion of the cantilever to the sample. To avoid this
in t
he resonance
equency (about 300 kHz) of the cantilever and the modulation frequency (several tens
bservation.
Topogra
ge
Observe the topographical image of a sample; make sure that the image is
click on the
Retract On
button to retract the tip.
Setting the lock-in amplifier
lock-in
MFM Image
raphical image (see Section 5.4.2).
a
ts from the Acquisition selection pull-down menu in the Scan
frame of the Advanced tab window.
t VE-AFM from the Mode selection pull-down menu.
■
Observing a VE-AFM image (optional)
Viscoelasticity image observation is an optional function that requires a lock-in amplifier
supplied to order. Connect the lock-in amplifier to the SPM controller and set the
software in accordance with the procedure in Section 5.2.5, “Lock-in amplifier.”
Usually, you
the sample, however, you
only perturbed imag
problem, use the AC mode. Then you can obtain good results. Viscoelasticity observation
he AC mode will be performed through use of the difference between t
fr
of kHz) for viscoelasticity o
phical ima
satisfactory; then
Carry out the same procedure as in Section 5.4.3, “Setting the
amplifier.”
1.
Obtain a desirable topog
2.
Stop scanning and enter the following parameters:
.
Select 4 Inpu
b.
Selec
c.
Enter information in the Display Source frame as follows:
3.
Click on the Advanced button (in the lower right section) in the Advanced tab
below.
window to open the Advance Control window. Click on the Display Source
tab to open the Display Source window; then enter data in the manner shown
