５
MEASUREMENT OPERATION
•
SV
TMPM5200-2
5-241
easurement, you can measure the change of the distance (S) between the tip
and specimen by sweeping the bias voltage with keeping the STM feedback on.
The position at which SV measurement is carried out is determined by using the
Position function in the Tip window.
You can perform SV measurement only in the STM mode.
In SV m
•
Clock/ms, Low Voltage/V, High Voltage/V, Ramp Direction, Number to Average,
Number of Points and SPS Mode
Specify these items in the same way as for IV.
•
Source
Select Topography for source because you measure the change of the distance
between the tip and specimen by sweeping the bias voltage in SV measure-
ment.
