５
MEASUREMENT OPERATION
TMPM5200-2
5-207
You can use the following modes when optional attachments are installed to perform
Viscoelasticity measurement (VE-AFM), L
al-Modulation measurement (LM-FFM),
ce Potential measurement (KFM) and Magnetic Force measurement (MFM; P-Lift,
Normal
elect this mode when you perform ordinary measurement (surface shape meas-
Select this mode when you perform Lateral-Modulation FFM measurement, which
When you actually perform Surface Potential measurement, there are other parame-
ters you need to set.
tic Force measure-
ment using the Point-by-Point Lift mode. Magnetic Force measurement is possible
in AC AFM mode.
When you actually perform the Magnetic Force measurement, there are other
parameters you need to set.
For more detail, refer to Section 5.10.3 “
■
Lift.”
•
L-Lift
Select this mode when you perform observations such as Magnetic Force measure-
ift mode. Magnetic Force measurement is possible in
Mode
ater
Surfa
L-Lift). However, you need the optional Viscoelasticity Lateral-Modulation FFM
attachment (Lock-in Amplifier) for using VE-AFM, LM-FFM and KFM. You also need
the optional Digital Controlled MFM Unit for using L-Lift.
•
S
urement).
•
VE-AFM
Select this mode when you perform Viscoelasticity measurement, which is possible
in the AC AFM and Contact AFM modes.
•
LM-FFM
is possible in the Contact AFM mode.
•
KFM
Select this mode when you perform Surface Potential measurement, which is
possible in the AC AFM mode.
For more detail, refer to Section 5.10.3 “
■
KFM.”
•
P-Lift
Select this mode when you perform observations such as Magne
ment using the Line-by-Line L
AC AFM mode.
When you actually perform Magnetic Force measurement, there are other parame-
ters you need to set.
For more detail, refer to Section 5.10.3 “
■
Lift.”
