TMPM5200-2
5-109
Observation
at acts between
the specimen and the cantilever tip. Unless this setting is carried out correctly,
damage the specimen or the cantilever. Set the repulsive force that acts between
Setting R
The
posit
V is, the larger the repulsive force becomes. If you perform
approaching under the condition of the Reference/V value set to –2 V, changing
Reference/V to the repulsive force side in excess of –2 V might sometimes make the
cantilever tip go away from the specimen surface, thus resulting in forming no image.
In the case of the Contact mode, generally, perform scanning in the domain of a small
repulsive force to avoid specimen damage. Then, set Reference/V to the position where
the cantilever tip and the specimen surface become closest to each other. However, in the
ma
(on
of Reference/V) would produce a good result.
Change the Reference/V value gradually from the value for approaching toward 0 V
(closer to the specimen surface) while watching the image, and set it to the value that
prod
this
Force curve measurement
b
the cantilever tip in the contact mode. This measurement is called Force Curve
measurement. The following is the procedure for Force Curve measurement.
Measurement Method
The procedure up to approaching is exactly the same as that for the measurement method
in the contact mode.
1.
Click on the
■
Topography Image
When approaching has completed, carry out scanning.
Click on the Repeat button on the
Advanced tab window
.
Scanning will start and an image will appear in the Display Window.
In the Contact mode, it is important to set the repulsive force th
not only will it be impossible to obtain a satisfactory image, but also you may
the specimen and the cantilever tip using Reference/V.
eference/V
more negative Reference/V is, the smaller the repulsive force becomes. The more
ive Reference/
case of a specimen having large unevenness or a specimen having a low contrast due to
terials attached to the specimen surface, scanning with a little larger repulsive force
the plus (+) side
uces the best-quality image.
Other general cautions, grabbing, storing and processing of an image are detailed later in
manual.
■
A force acting between the specimen surface and the cantilever tip is measured from the
ending of the cantilever while varying the distance between the specimen surface and
button in the Acquisition selection box and select Single
SPS from the pull-down menu.
