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MEASUREMENT OPERATION
TMPM5200-2
5-243
C (available only in AFM mode)
rm it in the contact AFM mode.
forth sweeping directions, and appears in different colors
for the respective sweeps on the same s
The position at which FC measurement is carried out is determined using the
Position function in the Tip window.
•
F
You can perform FC measurement in the contact AFM, AC or AFM mode. Usually,
perfo
In the FC mode, you can measure the change of the interatomic force due to the
bending of the cantilever by sweeping the distance between the tip and specimen.
Feedback is automatically turned off during measurement. FC measurement is
carried out in the back and
creen.
•
Clock/ms, Number to Average, Number of Points and SPS Mode
Specify
ms in the same way as for IV.
•
Tip Displ
m, Tip Offset/nm
Specify these items in the same way as for IS.
•
Ramp Direction
Specify the sweeping direction for the distance between the tip and the speci-
men.
In->Out->In:
First, the tip moves away from the specimen, and then it
approaches the specimen.
Out->In->Out:
First, the tip approaches the specimen, and then it moves
away from the specimen.
•
Source
Select Force for FC measurement because you measure the change of the in-
teratomic force when changing the distance between the tip and specimen.
these ite
acement/n
