5
MEASUREMENT OPERATION
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TMPM5200-2
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Lift
s
magnetic images as well as topographic images by detecting bending caused by the
local magnetic force on the surface of cantilever using the Phase signals
hic images. The process to
separate the cantilever from the specimen at that time is called the lift operation.
Scan Options
When the optional Viscoelasticity Lateral Modulation FFM (Lock-in Amplifier) is
installed in the instrument, use the Scan Options dialog box for setting the external
instruments. A detailed procedure for setting the Lock-in Amplifier is provided later.
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Clicking on the Lift button opens a dialog that you set at the lift operation.
The Magnetic Force measurement is an image acquisition method that acquire
effect of the
that react sensitively with minute signal changes, by separating the specimen from
the tip at a greater distance (the distance that causes no bending of the cantilever by
the interatomic force) than by measuring topograp
•
L
the amount to lift up the tip as lift-scan timing.
Lift Output AMP/V
When the tip is lifted up, it is necessary to change oscillation voltage to the cantile-
fting
up the tip. The specification is in effect only when lifting up the tip.
ift Height
Specify
•
ver in order to obtain beautiful MFM images. Therefore, specify the voltage of the
oscillation signal (Output AMP/V of the Cantilever Tuning window) before li