5-94
TMPM5200-2
Observ
1.
To s
click on t
n butto
Mod
indow.
The following images will be obtained.
■
ation of an image
tart scans,
he Sca
n in the Contact
e tab w
Topography
(Topography
Acos
φ
(Elasticity
Asin
φ
(Viscosity
image)
Sometimes an oscillating sound is made depending upon the characteristic
frequency of the scanner that you use. If it happens, reduce the oscillation level
(OSC Level/V), or shift the present oscillation frequency (OSC Fre-
quency/kHz) setting position until the sound is not made.
2.
Increase the input sensitivity of the lock-in amplifier (from 1 mV to 100 nV
direction) using the Sensitivity setting key (
▼
) in the range in which the
When using Model 5110 and the signal becomes saturated, the OLVD LED
ghts up.
cos
φ
(
ty) and Asin
ity are large.
3.
Specify the SPM parameters for usual operation so that you can obtain an
optimum topography image.
4.
Change the follow
parameters so that you can obtain an optimum
elasticity image as well as an optimum viscosity image.
n frequen
OSC Frequency/kHz)
If the difference of specimens in elasticity and viscosity is small, for example,
rease oscilla-
When using hard cantilevers such as a Si cantilever, reduce oscillation level to
observe the image. If oscillation level is too large, the cantilever may break. To
the contrary, when using soft cantilevers, increase oscillation level. Generally
speaking, when you measure viscoelasticity, to obtain a good image, use a hard
cantilever.
image)
image)
signals from the lock-in amplifier do not saturate.
li
The area in which both A
elastici
φ
(viscosity) images
become bright is the one in which elasticity and viscos
ing
•
Oscillatio
cy (
same kinds of materials such as composite plastic are mixed, inc
tion frequency, and then you will obtain better images.
•
Oscillation level (OSC Level/V)
