ADC12_B Introduction
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SLAU367P – October 2012 – Revised April 2020
Copyright © 2012–2020, Texas Instruments Incorporated
ADC12_B
34.1 ADC12_B Introduction
The ADC12_B module supports fast 12-bit analog-to-digital conversions. The module implements a 12-bit
SAR core, sample select control, and up to 32 independent conversion-and-control buffers. The
conversion-and-control buffer allows up to 32 independent analog-to-digital converter (ADC) samples to be
converted and stored without any CPU intervention.
ADC12_B features include:
•
200-ksps maximum conversion rate at maximum resolution of 12 bits
•
Monotonic 12-bit converter with no missing codes
•
Sample-and-hold with programmable sampling periods controlled by software or timers
•
Conversion initiation by software or timers
•
Software-selectable on-chip reference voltage generation (1.2 V, 2.0 V, or 2.5 V) with option to make
available externally
•
Software-selectable internal or external reference
•
Up to 32 individually configurable external input channels with single-ended or differential input
selection available
•
Internal conversion channels for internal temperature sensor and 1/2 × AV
CC
and four more internal
channels available on select devices (see the device-specific data sheet for availability and function)
•
Independent channel-selectable reference sources for both positive and negative references
•
Selectable conversion clock source
•
Single-channel, repeat-single-channel, sequence (autoscan), and repeat-sequence (repeated
autoscan) conversion modes
•
Interrupt vector register for fast decoding of 38 ADC interrupts
•
32 conversion-result storage registers
•
Window comparator for low-power monitoring of input signals of conversion-result registers
shows the block diagram of ADC12_B. The reference generation is located in the reference
module (REF) (see the device-specific data sheet).