Registers
566
SPRUH82C – April 2013 – Revised September 2016
Copyright © 2013–2016, Texas Instruments Incorporated
Enhanced High-Resolution Pulse-Width Modulator (eHRPWM)
16.4.6.2 Trip-Zone Control Register (TZCTL)
The trip-zone control register (TZCTL) is shown in
and described in
Figure 16-82. Trip-Zone Control Register (TZCTL)
15
4
3
2
1
0
Reserved
TZB
TZA
R-0
R/W-0
R/W-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 16-73. Trip-Zone Control Register (TZCTL) Field Descriptions
Bits
Name
Value
Description
15–4
Reserved
0
Reserved
3–2
TZB
0-3h
When a trip event occurs the following action is taken on output EPWMxB. Which trip-zone pins can
cause an event is defined in the TZSEL register (
0
High impedance (EPWMxB = High-impedance state)
1h
Force EPWMxB to a high state
2h
Force EPWMxB to a low state
3h
Do nothing, no action is taken on EPWMxB.
1–0
TZA
0-3h
When a trip event occurs the following action is taken on output EPWMxA. Which trip-zone pins can
cause an event is defined in the TZSEL register (
0
High impedance (EPWMxA = High-impedance state)
1h
Force EPWMxA to a high state
2h
Force EPWMxA to a low state
3h
Do nothing, no action is taken on EPWMxA.
16.4.6.3 Trip-Zone Enable Interrupt Register (TZEINT)
The trip-zone enable interrupt register (TZEINT) is shown in
and described in
.
Figure 16-83. Trip-Zone Enable Interrupt Register (TZEINT)
15
3
2
1
0
Reserved
OST
CBC
Rsvd
R-0
R/W-0
R/W-0
R-0
LEGEND: R/W = Read/Write; R = Read only; -
n
= value after reset
Table 16-74. Trip-Zone Enable Interrupt Register (TZEINT) Field Descriptions
Bits
Name
Value
Description
15-3
Reserved
0
Reserved
2
OST
Trip-zone One-Shot Interrupt Enable
0
Disable one-shot interrupt generation
1
Enable Interrupt generation; a one-shot trip event will cause a EPWMxTZINT interrupt.
1
CBC
Trip-zone Cycle-by-Cycle Interrupt Enable
0
Disable cycle-by-cycle interrupt generation.
1
Enable interrupt generation; a cycle-by-cycle trip event will cause an EPWMxTZINT interrupt.
0
Reserved
0
Reserved