Keithley 6430, Instruction Manual

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17-38 SCPI Command Reference
FAIL:SMLocation <NRf> | NEXT
PASS:SMLocation <NRf> | NEXT
:CALCulate2:CLIMits:FAIL:SMLocation <NRf> | Next Specify “ fail ” source memory location
:CALCulate2:CLIMits:PASS:SMLocation <NRf> | Next Specify “ pass ” source memory location
Parameters
<NRf> = 1 to 100 Specify memory location point
NEXT Next memory location point in list
(present lo 1)
Query
:SMLocation? Query “ pass ” or “ fail ” source memory location
Description
While using a Source Memory Sweep when performing limit tests, the
sweep can branch to a speci
fi ed memory location point or proceed to the
next memory location in the list.
When a memory location is speci
fi ed with PASS, the sweep will branch to
that memory location if the test is successful (PASS condition). If not suc-
cessful (FAIL condition), the sweep proceeds to the next memory location
in the list. With NEXT selected (the default), the sweep proceeds to the next
memory location (present lo 1) in the list regardless of the outcome
of the test (PASS or FAIL condition).
When a memory location is speci
fi ed with FAIL, the sweep will branch to
that location on a failure. If not (PASS condition), the sweep proceeds to the
next memory location in the list. With NEXT selected (the default), the
sweep proceeds to the next memory location (present lo 1) in the list
regardless of the outcome of the test (FAIL or PASS condition). Note that
branch on FAIL is available only via remote.
See Section 9,
Source memory sweep for more information.
:BCONtrol <name>
:CALCulate2:CLIMits:BCONtrol <name> Control Digital I/O port pass/fail update
Parameters
<name> = IMMediate Update output when fi rst failure occurs
END Update output after sweep is completed
Query
:BCONtrol? Query when digital output will update
Description
This command is used to control when the digital output will update to the
“ pass ” or “ fail ” bit pattern. The “ pass ” or “ fail ” bit pattern tells the handler
to stop the testing process and place the DUT in the appropriate bin.
With IMMediate selected, the digital output will update immediately to the
bit pattern for the
fi rst failure in the testing process. If all the tests pass, the
output will update to the “ pass ” bit pattern.
With END selected, the digital output will not update to the “ pass ” or “ fail ”
bit pattern until the SourceMeter completes the sweep or list operation. This
allows multiple test cycles to be performed on DUT. With the use of a scan-
ner card, multi-element devices (i.e. resistor network) can be tested. If, for
example, you didn't use END and the
fi rst element in the device package
passed, the “ pass ” bit pattern will be output. The testing process will stop
and the DUT will be binned. As a consequence, the other elements in the
device package are not tested.