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11-6
Limit Testing
Binning control
The binning control selection determines when the testing process stops and the appropriate
binning operation occurs. The results are communicated through the Digital I/O port based on
limit test data. (See
Binning systems
later in this section.) There are two types of binning con-
trol for the grading mode: immediate and end.
Immediate binning
—
Use immediate binning when you want to stop all testing after the
fi
rst failure occurs. Any pending tests will be cancelled, and the DUT will be placed in the bin
assigned to that test failure. If no failures occur, all enabled tests will be performed, and the
DUT will be placed in the assigned
“
pass
”
bin. This process is demonstrated in Figure 11-3.
Using a sweep with immediate binning lets you test different devices at different source lev-
els. For example, assume a 3-point linear sweep at 1V, 2V, and 3V step levels. The
fi
rst DUT is
tested at 1V, the second DUT is tested at 2V, and the third DUT is tested at 3V.
End binning
—
End binning allows a sweep to
fi
nish before performing the binning opera-
tion. In the event of a failure, the
fi
rst test failure determines the bin assignment. (See Figure
11-4.)
Using a sweep with end binning lets you test a device at different source levels. For exam-
ple, assume a 3-point list sweep at 1.1V, 2.2V, and 3.3V source levels. Limit testing will be per-
formed at each source level. After the completion of the three test cycles, the DUT is placed in
the appropriate bin.
Adding a scanner to the system lets you test each element of a multi-element device (i.e.,
resistor network). For example, the previous 3-point list sweep can be used to test a 3-element
resistor network. The
fi
rst test cycle (using the 1.1V source level) tests the
fi
rst element of the
network. The second test cycle (2.2V) tests the second element of the network, and last test
cycle (3.3V) tests the third element. After the three test cycles are
fi
nished, the resistor network
is placed in the appropriate bin.
Test1
Test2
Test3
Pass
Fail
Pass
Digital I/O
Pass/Fail
Notification
Figure 11-3
Immediate binning
Test1
(Pass)
Test2
(Fail)
Test3
(Pass)
Fail
Digital I/O
Notification
Figure 11-4
End binning
Summary of Contents for 6430
Page 26: ......
Page 32: ......
Page 78: ...2 14 Connections ...
Page 98: ...3 20 Basic Source Measure Operation ...
Page 138: ...5 30 Source Measure Concepts ...
Page 156: ...6 18 Range Digits Speed and Filters ...
Page 168: ...7 12 Relative and Math ...
Page 176: ...8 8 Data Store ...
Page 202: ...9 26 Sweep Operation ...
Page 248: ...11 22 Limit Testing ...
Page 310: ...16 6 SCPI Signal Oriented Measurement Commands ...
Page 418: ...17 108 SCPI Command Reference ...
Page 450: ...18 32 Performance Verification ...
Page 477: ...A Specifications ...
Page 489: ...B StatusandErrorMessages ...
Page 498: ...B 10 Status and Error Messages ...
Page 499: ...C DataFlow ...
Page 503: ...D IEEE 488BusOverview ...
Page 518: ...D 16 IEEE 488 Bus Overview ...
Page 519: ...E IEEE 488andSCPI ConformanceInformation ...
Page 523: ...F MeasurementConsiderations ...
Page 539: ...G GPIB488 1Protocol ...
Page 557: ......