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2 CMOS
2.4 Cgb-Freq Log: Cgb-f characteristics (A.01.20)
[Supported Analyzer]
B1500A
[Description]
Measures MOSFET's characteristics of gate-to-substrate capacitance (Cgb, linear) vs frequency (f, log). The
measurement frequency is 10 points per decade.
For a more accurate measurement, perform correction data measurement at the measurement frequency before
starting the capacitance measurement.
If the measurement frequency is not included in the list of default frequencies below, click the Advanced
Options... button and set the measurement frequency on the Frequency area of the Advanced Options for CMU
Calibration window.
Default frequencies:
1 k, 2 k, 5 k, 10 k, 20 k, 50 k, 100 k, 200 k, 500 k, 1 M, 1.2 M, 1.5 M, 2 M, 2.5 M, 2.7 M, 3 M, 3.2 M, 3.5 M,
3.7 M, 4 M, 4.2 M, 4.5 M, 5 MHz
[Device Under Test]
MOSFET, 4 terminals
Connect Gate to the CMU Low and Substrate to the CMU High. And connect Drain and Source to the GNDU.
[Required Modules and Accessories]
Agilent B1520A MFCMU 1 unit
[Device Parameters]
Polarity: Nch (CMU forces the specified value) or Pch (CMU forces the negative specified value)
Lg: Gate length
Wg: Gate width
Temp: Temperature
[Test Parameters]
IntegTime: Integration time
Gate: CMU connected to Gate terminal, CV sweep measurement
Source: SMU connected to Source terminal, constant voltage output
FreqStart: Sweep start frequency
NoOfDecade: Number of decades for data collection
OscLevel: Measurement signal level
Vgs: Voltage for Gate terminal, constant voltage output
[Extended Test Parameters]
G_Min: Minimum transconductance value for graph
G_Max: Maximum transconductance value for graph
Cp_Min: Minimum capacitance value for graph
Cp_Max: Maximum capacitance value for graph
Vs: Voltage for Source terminal
IsLimit: Source current compliance
[Measurement Parameters]
Parallel capacitance Cp
Conductance G
[User Function]
Circular constant PI=3.141592653589
Agilent EasyEXPERT Application Library Reference, Edition 8
2-8