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14 SPGU_PLSDIV
14.3 SPGU PLSDIV Id-Vg (A.05.03.2013.0124_2013.02.27.1)
[Supported Analyzer]
B1500A
[Description]
Measures the drain current vs gate voltage characteristics of MOSFET with pulsed gate and drain voltage
using SPGU.
[Reference]
Easy High Power Pulsed IV Measurement Using the Agilent B1500A's HV-SPGU Module
http://cp.literature.agilent.com/litweb/pdf/5990-3786EN.pdf
[Device Under Test]
MOSFET
[Device Parameters]
Lg: Gate length
Wg: Gate width
Temp: Temperature
[Test Parameters]
Period: Pulse period
Period_adj: The time for compensating the period setting (*1)
(*1) SPGU PLDIV is realized by repeating a single pulse, thus the actual period is 'Period' plus overhead to
repeat a single pulse. Period_adj is the overhead value for compensating the actual period. You have to monitor
the actual waveform by an oscilloscope to tune it. The default value is tuned for B1500A A.05.02 on Windows
7.
Gate: Gate terminal definition
VgStart: Gate start voltage
VgStop: Gate stop voltage
VgStep: Gate step voltage
VgBase: Gate pulse base voltage
GateDelay: Gate pulse delay time
GateWidth: Gate pulse width
GateTransition: Gate pulse transition (leading, trailing) time
Drain: Drain terminal definition
Vd: Drain bias
IdLimit: Current limitation for drain terminal
DrainDelay: Drain pulse delay time
DrainWidth: Drain pulse width
DrainTransition: Drain pulse transition (leading, trailing) time
MeasDelay: Delay till start of measurement
MeasInterval: Measuring interval
NumOfAverage: Measurement repetitions
[Extended Test Parameters]
LogLevel: Disable (0) or Enable (>=1)
LogFile: Absolute path name of the log file
LoopMax: Maximum loop count of measurement adjustment
Agilent EasyEXPERT Application Library Reference, Edition 8
14-7