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7 MixedSignal
7.11
Ic-Vc Vb Mismatch: Ic-Vce characteristics mismatch, Vb sweep (A.01.20)
[Supported Analyzer]
B1500A
[Description]
Measures the collector current vs collector voltage (Ic-Ice) characteristics of device A, and measures the Ic-Ice
characteristics of device B. After that, calculates the differences between Ic values by using the following
formula, and plots the results.
Delta_Ic=(Icollector_A-Icollector_B)/Icollector_A*100
[Device Under Test]
Bipolar transistor, 4 terminals, 2 ea.
[Device Parameters]
Polarity: NPN (SMUs force the specified value) or PNP (SMUs force the negative specified value).
Le: Emitter length
We: Emitter width
Temp: Temperature
IcMax: Collector current compliance
[Test Parameters]
IntegTime: Integration time
CollectorA: SMU connected to Device A Collector terminal, primary sweep voltage output
CollectorB: SMU connected to Device B Collector terminal, primary sweep voltage output
VcStart: Sweep start voltage for Collector terminal
VcStop: Sweep stop voltage for Collector terminal
VcStep: Sweep step voltage for Collector terminal
BaseA: SMU connected to Device A Base terminal, secondary sweep voltage output
BaseB: SMU connected to Device B Base terminal, secondary sweep voltage output
VbStart: Sweep start voltage for Base terminal
VbStop: Sweep stop voltage for Base terminal
VbStep: Sweep step voltage for Base terminal
Emitter: SMU connected to Emitter terminal, constant voltage output
Subs: SMU connected to Substrate, constant voltage output
Vsubs: Substrate voltage
IsubsLimit: Substrate current compliance
[Extended Test Parameters]
Ve: Emitter voltage
HoldTime: Hold time
DelayTime: Delay time
BaseMinRng: Minimum range for the base current measurement
CollectorMinRng: Minimum range for the collector current measurement
[Device A: Measurement Parameters]
Collector current IcollectorA
Base current IbaseA
[Device A: User Function]
hfe_A=IcollectorA/IbaseA
[Device A: X-Y Plot]
X axis: Collector voltage VcollectorA (LINEAR)
Agilent EasyEXPERT Application Library Reference, Edition 8
7-21
Содержание EasyEXPERT
Страница 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Страница 17: ...1 BJT ...
Страница 63: ...2 CMOS ...
Страница 119: ...3 Discrete ...
Страница 127: ...4 GenericTest ...
Страница 133: ...5 MCSMU_IV ...
Страница 141: ...6 Memory ...
Страница 211: ...7 MixedSignal ...
Страница 249: ...8 NanoTech ...
Страница 265: ...9 Organic ...
Страница 269: ...10 PwrDevice ...
Страница 285: ...11 Reliability ...
Страница 377: ...12 Sample ...
Страница 381: ...13 Solar Cell ...
Страница 401: ...14 SPGU_PLSDIV ...
Страница 409: ...15 Structure ...
Страница 459: ...16 TFT ...
Страница 463: ...17 Utility ...
Страница 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Страница 479: ...18 WGFMU ...
Страница 493: ...19 WGFMU_IV ...
Страница 497: ...19 WGFMU_IV Id Drain current Vg gate voltage Agilent EasyEXPERT Application Library Reference Edition 8 19 5 ...
Страница 501: ...19 WGFMU_IV Id Drain current Vd Drain voltage Agilent EasyEXPERT Application Library Reference Edition 8 19 9 ...
Страница 505: ...20 GaN Diode ...
Страница 511: ...21 GaN FET ...
Страница 523: ...22 IGBT ...
Страница 549: ...23 Interconnection ...
Страница 553: ...24 MISCAP ...
Страница 561: ...25 PowerBJT ...
Страница 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Страница 577: ...26 PowerDiode ...
Страница 585: ...27 PowerMOSFET PMIC SiC ...