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11 Reliability
Vd3: Drain terminal voltage
IdsStopRate: Ids change rate to stop testing
[Extended Test Parameters]
StoringRuntimeData: Data save during stress output, Yes or No
[Extended Test Parameters for Sampling_Stress]
Vd: Drain terminal voltage, constant voltage
Vs: Source terminal voltage, constant voltage
IgLimit: Gate current compliance
[Extended Test Parameters for IvSweep_ConstId]
HoldTime: Hold time
DelayTime: Delay time
Vs: Source terminal voltage, constant voltage
DrainMinRng: Minimum range for drain current measurement
[Extended Test Parameters for IvSweep_gmmax]
HoldTime: Hold time
DelayTime: Delay time
IgLimit: Gate current compliance
Vs: Source terminal voltage, constant voltage
DrainMinRng: Minimum range for drain current measurement
[Extended Test Parameters for Sampling_Ids]
IgLimit: Gate current compliance
Vs: Source terminal voltage, constant voltage
DrainMinRng: Minimum range for drain current measurement
[Measurement Parameters]
[Measurement Parameters by Sampling_Stress]
Gate current Igate
[Measurement Parameters by IvSweep_ConstId]
Drain current Idrain
[Measurement Parameters by IvSweep_gmmax]
Drain current Idrain
[Measurement Parameters by IvSweep_Ids]
Drain current Idrain
[User Function]
[User Function for IvSweep_ConstId]
Maximum drain current value IdMax=max(abs(Idrain)) (For initial measurement only)
[User Function for IvSweep_gmmax]
Maximum drain current value IdMax=max(abs(Idrain)) (For initial measurement only)
Transconductance gm=diff(Idrain,Vgate)
Maximum transconductance value gmMax=max(gm)
[Analysis Function]
[Analysis Function for IvSweep_ConstId]
Vth@Id=@L1X (X intercept of Line1)
Agilent EasyEXPERT Application Library Reference, Edition 8
11-36