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What is described in the reference sections
Reference section contains detailed description of test definitions. The test definitions are
listed in alphabetical order. Each entry explains one test definition and provides the
information following to the next terms. Some sections may not follow to some terms and
may follow to the terms not in this table.
Term
Description
Description
Brief explanation of the test definition.
Device Under Test
DUT name. The number of terminals, the connection
information, and the other information may be included.
Required Modules and
Accessories
Lists the required accessories, modules, and/or equipment.
The connection information may be included.
Required Test Definition
Lists the test definitions if they are used in this test
definition.
Device Parameters
Lists the parameters changeable in the Device Parameters
area of the EasyEXPERT Application Test screen.
Test Parameters
Lists the parameters changeable in the Test Parameters
area of the EasyEXPERT Application Test screen.
Extended Test Parameters
Lists the parameters changeable in the dialog box opened
by clicking the Extended Setup button.
Measurement Parameters
Lists the parameters measured by this test definition.
User Function and
Analysis Function
Lists the parameters used for the user function or the
analysis function.
X-Y Plot or X-Y Graph
Lists the parameters to be displayed in the X-Y Graph Plot
area, List Display area, or Parameters area on the Data
Display window.
List Display
Parameters Display Area
Auto Analysis
Lists the parameters used for the auto analysis function.
Test Output: X-Y Graph
Lists the parameters defined in the Test Output tab screen
of the Test Definition window. The parameters will be
displayed in the X-Y Graph Plot area, List Display area, or
Parameters area on the Data Display window.
Test Output: List Display
Test Output: Parameters
Содержание EasyEXPERT
Страница 1: ...Agilent Technologies Agilent EasyEXPERT Application Library Reference ...
Страница 17: ...1 BJT ...
Страница 63: ...2 CMOS ...
Страница 119: ...3 Discrete ...
Страница 127: ...4 GenericTest ...
Страница 133: ...5 MCSMU_IV ...
Страница 141: ...6 Memory ...
Страница 211: ...7 MixedSignal ...
Страница 249: ...8 NanoTech ...
Страница 265: ...9 Organic ...
Страница 269: ...10 PwrDevice ...
Страница 285: ...11 Reliability ...
Страница 377: ...12 Sample ...
Страница 381: ...13 Solar Cell ...
Страница 401: ...14 SPGU_PLSDIV ...
Страница 409: ...15 Structure ...
Страница 459: ...16 TFT ...
Страница 463: ...17 Utility ...
Страница 478: ...17 Utility Agilent EasyEXPERT Application Library Reference Edition 8 17 16 ...
Страница 479: ...18 WGFMU ...
Страница 493: ...19 WGFMU_IV ...
Страница 497: ...19 WGFMU_IV Id Drain current Vg gate voltage Agilent EasyEXPERT Application Library Reference Edition 8 19 5 ...
Страница 501: ...19 WGFMU_IV Id Drain current Vd Drain voltage Agilent EasyEXPERT Application Library Reference Edition 8 19 9 ...
Страница 505: ...20 GaN Diode ...
Страница 511: ...21 GaN FET ...
Страница 523: ...22 IGBT ...
Страница 549: ...23 Interconnection ...
Страница 553: ...24 MISCAP ...
Страница 561: ...25 PowerBJT ...
Страница 576: ...25 PowerBJT Agilent EasyEXPERT Application Library Reference Edition 8 25 16 ...
Страница 577: ...26 PowerDiode ...
Страница 585: ...27 PowerMOSFET PMIC SiC ...