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1 BJT
1.11 Cte-Ve: Cte-Veb characteristics (A.01.20)
[Supported Analyzer]
B1500A
[Description]
Measures the Base-Emitter capacitance (Cte), and plots the Cte-Veb characteristics.
For a more accurate measurement, perform correction data measurement at the measurement frequency before
starting the capacitance measurement.
If the measurement frequency is not included in the list of default frequencies below, click the Advanced
Options... button and set the measurement frequency on the Frequency area of the Advanced Options for CMU
Calibration window.
Default frequencies:
1 k, 2 k, 5 k, 10 k, 20 k, 50 k, 100 k, 200 k, 500 k, 1 M, 1.2 M, 1.5 M, 2 M, 2.5 M, 2.7 M, 3 M, 3.2 M, 3.5 M,
3.7 M, 4 M, 4.2 M, 4.5 M, 5 MHz
[Device Under Test]
Bipolar transistor
Connect Base to the CMU Low, Emitter to the CMU High, and the other terminals to the GNDU.
[Device Parameters]
Polarity: NPN (CMU forces the specified value) or PNP (CMU forces the negative specified value).
Le: Emitter length
We: Emitter width
Temp: Temperature
[Test Parameters]
HoldTime: Hold time
DelayTime: Delay time
IntegTime: Integration time
FREQ: Measurement frequency
OscLevel: Measurement signal level
Base: CMU connected between Base and Emitter (CV sweep measurement)
VebStart: DC bias start voltage
VebStop: DC bias stop voltage
VebStep: DC bias step voltage
[Measurement Parameters]
Parallel capacitance Cp
Conductance G
[User Function]
PI=3.141592653589
D=G/(2*PI*FREQ*Cp)
Rp=1/G
Cs=(1+D^2)*Cp
X=-1/(2*PI*FREQ*Cs)
Rs=D*abs(X)
Z=sqrt(Rs^2+X^2)
Theta=atan(X/Rs)
Veb=Vemitter
CtePerArea=Cp/Le/We
Agilent EasyEXPERT Application Library Reference, Edition 8
1-15