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17 Utility
17.10 Subsite move: Probing next subsite (A.02.00)
[Supported Analyzer]
B1500A, B1505A, 4155B, 4155C, 4156B, 4156C
[Description]
Moves wafer prober chuck to the next subsite, reads
device ID from the prober, and sets it to the Device ID of
the test record.
[Supported Probers]
While this application test supports Cascade Microtech,
SUSS MicroTec and Vector Semiconductor wafer prober drivers
as standard basis, you may specify a command path name into
the CustomProber entry field to operate with a non-standard
wafer prober driver.
[Test Parameters]
ProberType: Type of wafer prober
CustomProber: Command path name for non-standard wafer probers
If CustomProber is not blank, ProberType field is ignored.
Agilent EasyEXPERT Application Library Reference, Edition 8
17-12