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2 CMOS
2.26 Simple Cgb : Evaluation of gate-substrate capacitance versus gate voltage
(A.01.10)
[Supported Analyzer]
B1500A
[Application]
This application evaluates the gate-substrate capacitance of an Nch MOSFET.
For a more accurate measurement, perform correction data measurement at the measurement frequency before
starting the capacitance measurement.
If the measurement frequency is not included in the list of default frequencies below, click the Advanced
Options... button and set the measurement frequency on the Frequency area of the Advanced Options for CMU
Calibration window.
Default frequencies:
1 k, 2 k, 5 k, 10 k, 20 k, 50 k, 100 k, 200 k, 500 k, 1 M, 1.2 M, 1.5 M, 2 M, 2.5 M, 2.7 M, 3 M, 3.2 M, 3.5 M,
3.7 M, 4 M, 4.2 M, 4.5 M, 5 MHz
[Device Measured]
Single device with four terminals.
[Parameter Setting]
Test parameters are specified for NMOS device under test.
Swept bias voltage parameters are specified by the gate voltage referenced to the source voltage (Vgs).
[Description of Measurement]
Gate voltage (Vgs) sweeps in accordance with the test parameter setting.
Gate capacitances are measured with Cp-G model applied while the bias voltage sweeps.
[Plot Display]
Measured gate capacitances in linear scale are plotted versus substrate voltage on the linear horizontal axis.
Agilent EasyEXPERT Application Library Reference, Edition 8
2-42