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Memory NorFlash
DataDisturb(WrittenCell) B1500A [SPGU 1, SMU 2, ASU+SMU 2] or
[SPGU 1, SMU 4, 16440A/16445A 1]
MixedSignal BJT Varactor CV Mismatch B1500A MFCMU 1
Diff-R Mismatch B1500A SMU 8
Diode IV Fwd Mismatch B1500A SMU 3
Diode IV Rev Mismatch B1500A SMU 3
G-Plot ConstVce Mismatch B1500A SMU 6
G-Plot ConstVce
Mismatch[3] B1500A SMU 5
G-Plot Vbc=0V Mismatch B1500A SMU 6
G-Plot Vbc=0V Mismatch[3] B1500A SMU 5
Ic-Vc Ib Mismatch B1500A SMU 6
Ic-Vc Ib Mismatch[3] B1500A SMU 5
Ic-Vc Vb Mismatch B1500A SMU 6
Ic-Vc Vb Mismatch[3] B1500A SMU 5
Id-Vd Mismatch B1500A SMU 5
Id-Vd Mismatch[3] B1500A SMU 4
Id-Vg Mismatch B1500A SMU 5
Id-Vd Mismatch[3] B1500A SMU 4
MIM CV Mismatch B1500A MFCMU 1
MOS Varactor CV Mismatch B1500A MFCMU 1
Poly-R Mismatch B1500A SMU 7
NanoTech CNT Differential R[AC] B1500A MFCMU 1
CNT Gate Leak B1500A,4155B/C,4156B/C SMU 2
CNT Id-Time B1500A,4156B/C SMU 4
CNT Id-Vd B1500A,4155B/C,4156B/C SMU 4
CNT Id-Vg B1500A,4155B/C,4156B/C SMU 4
CNT Id-Vg-Time B1500A,4156B/C SMU 4
CNT IV Sweep B1500A,4155B/C,4156B/C SMU 2
CNT R-I Kelvin 2SMU B1500A,4155B/C,4156B/C SMU 2
CNT R-V Kelvin 2SMU B1500A,4155B/C,4156B/C SMU 2
CNT Vth gmMax B1500A,4155B/C,4156B/C SMU 4
Organic 2-terminal dual Vsweep B1500A [SMU 1 and GNDU] or SMU 2
PwrDevice BVdss[3] PwrDevice B1500A SMU 3
BVgso[3] PwrDevice B1500A SMU 2
Id-Vd pulse[3] PwrDevice B1500A SMU 3
Category Test definition name Supported analyzer Required equipment and quantity