
1-32
General Information
Specifications
VC-4 and VC-3 POH: J1, C2, G1, F2,
H4, Z3 to Z5.
J1 Path Trace: 64 byte or 16 byte, ITU-
T E.164 sequence or user defined byte.
VC-12 POH: J2, V5 signal label.
J2 Path Trace: 16 byte ITU-T E.164
sequence or user defined byte.
Pointer adjustment generation:
Increment/Decrement: The adjust
pointer key provides a burst selectable
between 1 and 10 pointer adjustments
(between 1 and 5 for TU-12 and TU-2
pointer).
Frequency offset: these 87:3 pointer
sequences are generated by offsetting
the frequencies of the AU-4 (or TU-3,
TU-12, TU-2) and the line rate relative
to each other. Range:100 ppm in 0.1
ppm steps.
New pointer value: The AU-4, TU-3,
TU-12 or TU-2 moves to a selectable
new location in a single jump, with or
without an accompanying new data flag
(NDF).
ITU-T G.783 sequences: Bursts of
periodic single adjustments with added
or cancelled adjustments. Polarity is
selectable.
Bursts of periodic double adjustments
with pairs alternating in polarity.
In all cases the interval between
adjustments or pairs of adjustments is
programmable.
Error Generation
Error type
Single
Rate 10
-N
Other
Frame A1A2
*
N in 4 frame words (STM-1 Only)
B1
*
4 - 9
STM-1 Only
B2
*
3 - 9
STM-1 Only
AU-4 Path BIP-8
*
4 - 9
MS FEBE
*
3 - 9
AU-4 Path FEBE
*
4 - 9
AU-4 Path IEC
*
4 - 9
TU-3 Path BIP-8
*
3 - 9
TU-3 Path FEBE
*
3 - 9
TU-2 Path BIP
*
4 - 9
TU-2 Path FEBE
*
5 - 9
TU-12 BIP
*
3 - 9
Summary of Contents for 37717C
Page 2: ...HP 37717C Communications Performance Analyzer Calibration Manual ...
Page 5: ...2 ...
Page 21: ...xviii Contents ...
Page 109: ...2 20 Installation Additional Precautions for Service Engineers ...
Page 312: ...3 203 Performance Tests Trigger Output Option UKZ Figure 3 57 Monitor Input Test Setup ...
Page 375: ...3 266 Performance Tests Performance Test Record ...
Page 379: ...4 4 Installation Current Previous Terminology ...
Page 392: ...B 9 Appendix B Fitting Calibrating Testing New Modules Typical Jitter Transmit Spectrum ...
Page 393: ...B 10 Appendix B Fitting Calibrating Testing New Modules ...