FISCHER FISCHERSCOPE X-RAY XDLM 231, Operator'S Manual

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150 FISCHERSCOPE ® X-RAY
Calibration, Base Correction and Reference Measurement
Depending on the measuring application, different prompts will appear that have the following
meaning:

Scatt A scatter spectrum shall be measured. As a rule, it is already
saved in the software and can be opened automatically from the
menu
General > Load Spectrum and Evaluate… . Measure a
scatter spectrum (e.g., plastic) if the spectrum does not exist.

Element: Ni The pure element Ni from the pure element board shall be
measured.

Base material Cal. Std.
Set (Analysis) The base material of the calibration standard set shall be
measured.
Example: If you calibrate using the calibration standard set
Ni/Cu alloy, Cu is the base material of the calibration
standard set.

Base material specimen
(Analysis) The base material of the real part shall be measured. An
uncoated real part must be used for this purpose.

Base (specimen) The base material of the real part shall be measured. An
uncoated real part must be used for this purpose.

Ni-Zn/Fe 5.0 15.0 0.0 A calibration standard made of NiZn/Fe with a coating thickness
of 5 μm and a Ni content of 15 % shall be measured.
13.Position the standard, close the measuring chamber, adjust the focus and click Start .
The instrument will perform the measurement.
After the measurement, you will be prompted either to measure a new standard or to measure
the same standard one more time. If you measure the same standard again, move it slightly to
measure it at a different location.