FISCHERSCOPE
®
X-RAY XDLM
®
202
Description
The FISCHERSCOPE X-RAY XDLM are universally applicable energy dispersive x-ray
fluorescence measuring instruments. The instruments are well suited for measuring and
analysing thin coatings, even at small concentrations, in quality assurance, incoming
inspection and process control.
Typical fields of application:
• Measurement of electroplated mass-produced parts
• Inspection of thin coatings with small measurement spots
• Analysis of functional coatings in the electronics and semiconductor industries
• Automated measurements, e.g., on printed circuit boards
To create ideal excitation conditions for every measurement, the instrument features
electrically changeable apertures and primary filters. A high count rate is achieved by
using a proportional counter tube, which allows for precise measurements.
Outstanding accuracy and long-term stability are characteristics of all FISCHERSCOPE
X-RAY systems. The necessity of recalibration is considerably reduced, saving time and
effort.
The fundamental parameter method by FISCHER allows for the analysis of solid and
liquid specimens as well as coating systems without calibration.
Design
The FISCHERSCOPE X-RAY XDLM instruments are modularly designed as user-friendly
bench-top instruments. According to the intended use, different versions are available:
XDLM 231: Plane support stage, motor-driven Z-axis
XDLM 232: Manually operable XY-stage, motor-driven Z-axis
XDLM 237: Motor-driven XY-stage that moves into the loading position automatically,
when the protective hood is opened. Motor-driven programmable Z-axis
A high-resolution colour video camera simplifies the precise determination of the meas-
urement spot. A laser pointer serves in all models as a positioning aid and supports
the quick alignment of the sample to be measured.
A gap in the housing allows for measurements on large flat specimens, which do not
fit in the measuring chamber, e.g. large printed circuit boards.
The integrated video-microscope with zoom and crosshairs simplifies sample place-
ment and allows for a precise measuring spot adjustment.
The entire operation and evaluation of measurements as well as the clear presentation
of measurement data is performed on a PC, using the powerful and user-friendly
WinFTM
®
software.
The FISCHERSCOPE XDLM fulfills DIN ISO 3497 and ASTM B 568. It is a fully
protected instrument with type approval according to the German regulations
„Deutsche Röntgenverordnung-RöV“.
Summary of Contents for FISCHERSCOPE X-RAY XDLM 231
Page 8: ...6 FISCHERSCOPE X RAY Table of Contents...
Page 14: ...12 FISCHERSCOPE X RAY Safety Information...
Page 30: ...28 FISCHERSCOPE X RAY Set up...
Page 36: ...34 FISCHERSCOPE X RAY WinFTM File Structure...
Page 52: ...50 FISCHERSCOPE X RAY User Interface of the WinFTM Software...
Page 134: ...132 FISCHERSCOPE X RAY Def MA...
Page 146: ...144 FISCHERSCOPE X RAY Programming Coordinates for Automatic Measurements XDLM 237...
Page 186: ...184 FISCHERSCOPE X RAY Pattern Recognition XDLM 237...
Page 192: ...190 FISCHERSCOPE X RAY Cleaning and Maintenance...
Page 202: ...200 FISCHERSCOPE X RAY Addendum...
Page 228: ...226 FISCHERSCOPE X RAY WinFTM SUPER For the Experienced X RAY User...
Page 229: ...FISCHERSCOPE X RAY 227...
Page 232: ......