FISCHER FISCHERSCOPE X-RAY XDLM 231, Operator'S Manual

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FISCHERSCOPE ® X-RAY 13
Instrument Overview
2 Instrument Overview
The FISCHERSCOPE ® X-RAY is a high performance energy dispersive x-ray fluorescence (EDXRF)
spectrometer.
The WinFTM ® ( F ischer T hickness M anagement Software for Win dows ® ) software controls the in-
strument and handles the evaluation of the signals supplied by the instrument.
The measured values (coating thickness, material compositions, mass per unit area) are stored and
displayed on the monitor. Using WinFTM, you can conveniently design the measurement results as
a print form for printout and export them to other applications.
WinFTM runs under Windows ® .
2.1 Areas of Application
The instrument is suited for the following measurement applications:

Analysis of solid, powdery and compound materials and liquids

Measurement of the composition and coating thicknesses of complex multi-layered systems
The instrument XDLM 237 is equipped with a programmable XY-stage, which allows for automated
measurements.
2.2 Standard-free Measurements
The instrument allows for standard-free measurements, that is measurements without calibration
standards. Coating thicknesses and compositions can be determined in one measurement without
the use of calibration standards. This is especially interesting when you develop new multi-layered
systems, where applicable calibration standards are not available.